JPH0174575U - - Google Patents
Info
- Publication number
- JPH0174575U JPH0174575U JP1987168960U JP16896087U JPH0174575U JP H0174575 U JPH0174575 U JP H0174575U JP 1987168960 U JP1987168960 U JP 1987168960U JP 16896087 U JP16896087 U JP 16896087U JP H0174575 U JPH0174575 U JP H0174575U
- Authority
- JP
- Japan
- Prior art keywords
- pins
- pin
- supports
- support member
- pin support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
Landscapes
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987168960U JPH0174575U (en]) | 1987-11-06 | 1987-11-06 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987168960U JPH0174575U (en]) | 1987-11-06 | 1987-11-06 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0174575U true JPH0174575U (en]) | 1989-05-19 |
Family
ID=31458600
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987168960U Pending JPH0174575U (en]) | 1987-11-06 | 1987-11-06 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0174575U (en]) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007055012A1 (ja) * | 2005-11-10 | 2007-05-18 | Nhk Spring Co., Ltd. | コンタクトユニットおよび検査システム |
-
1987
- 1987-11-06 JP JP1987168960U patent/JPH0174575U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007055012A1 (ja) * | 2005-11-10 | 2007-05-18 | Nhk Spring Co., Ltd. | コンタクトユニットおよび検査システム |